News
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- Apr 14, 2026
- Tokyo Electron Device and ITES Collaborate on an inspection solution that visualizes latent defects in SiC devices at the wafer level
- Supporting the development of highly reliable SiC devices by reducing materials evaluation lead time through the development and sales of a new UV-laser-based product, the “SiC Latent Defect Inspection System / Current-Stress Degradation Simulator ITS-SCX100” -
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- Apr 14, 2026
- We will have a maintenance of server from 12:00 - 13:00 (JST) on April 15, 2026.
Please note that our web site may not be available during the server maintenance.
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- Mar 30, 2026
- Announcement on Changes of Officers
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- Feb 26, 2026
- An analyst report by Omega Investment (JI Discovery) has been published.
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- Feb 02, 2026
- Consolidated Financial Results for the Nine Months Ended December 31, 2025(Under Japanese GAAP)
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- Feb 02, 2026
- 2026 Q3 IR Presentation Materials Posted
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- Feb 02, 2026
- Announcement on Change of Representative Directors
