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TOKYO ELECTRON DEVICE AMERICA

News

• Apr 14, 2026

  Tokyo Electron Device and ITES Collaborate on an inspection solution that visualizes latent defects in SiC devices at the wafer level
  - Supporting the development of highly reliable SiC devices by reducing materials evaluation lead time through the development and sales of a new UV-laser-based product, the “SiC Latent Defect Inspection System / Current-Stress Degradation Simulator ITS-SCX100” -

• Apr 14, 2026

  We will have a maintenance of server from 12:00 - 13:00 (JST) on April 15, 2026.
  Please note that our web site may not be available during the server maintenance.

• Mar 30, 2026

  Announcement on Changes of Officers

• Feb 26, 2026

  An analyst report by Omega Investment (JI Discovery) has been published.

• Feb 02, 2026

  Consolidated Financial Results for the Nine Months Ended December 31, 2025(Under Japanese GAAP)

Term Management Plan “VISION 2030” Introduction Video